制造商 | 部件名 | 数据表 | 功能描述 |
Aries Electronics, Inc.
|
23022 |
1Mb/2P |
Kelvin Test Socket |
10003 |
829Kb/2P |
Universal Test Socket Receptacle |
18108 |
1Mb/1P |
Test Socket Breakout Board |
24-6556-10 |
705Kb/2P |
Universal Test Socket Receptacle |
10012 |
529Kb/1P |
Universal PLCC ZIF Test Socket |
10015 |
766Kb/1P |
Zero-Insertion-Force Test Socket |
10010 |
1Mb/2P |
Universal PLCC ZIF Test Socket |
10019 |
630Kb/1P |
Zero-Insertion-Force DIP Test Socket |
526 |
647Kb/1P |
Test Point Openings Reach All Pins |
24-3551-10 |
535Kb/1P |
Universal Zero-Insertion-Force DIP Test Socket |
24001 |
724Kb/1P |
RF Test Socket w/Replaceable Contact Strips |
20-537-20 |
491Kb/1P |
Insert Plates for Universal PLCC ZIF Test Socket |
44-547-11 |
733Kb/1P |
Universal SOIC ZIF (Zero-Insertion-Force) Test Socket |
84-537-21 |
1Mb/2P |
?쁋ive Bug??Type Universal PLCC ZIF Test Socket |
24-3551-18 |
642Kb/1P |
High-Temperature Universal Zero-Insertion-Force DIP Test Socket |
10002 |
716Kb/1P |
High-Temp Universal ZIF DIP Burn-in & Test Socket |
10001 |
722Kb/1P |
Series 55 Universal Zero-Insertion-Force DIP Test Socket |
24-3570-10 |
551Kb/2P |
Quick-Release Universal Zero-Insertion-Force DIP Test Socket |
24014 |
3Mb/3P |
CSP Test Socket for Optical Laser Failure Analysis Emission Microscopy |
23023 |
3Mb/3P |
CSP Test Socket for Optical Laser Failure Analysis w/Emission Microscopy |